- NY CREATES (Albany, NY)
- …Category: Engineering Posted On: Thu Jan 30 2025 Job Description: Job Description for Metrology Services FIB / TEM /Technician JOB SUMMARY NY-CREATES is ... if needed + Other reasonable duties as assigned. Job Requirements: Minimum Requirements for Metrology Services FIB / TEM /Technician + An associate's degree… more
- Applied Materials (Santa Clara, CA)
- …process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... instructions. + Operate metrology tools in the FIB & TEM lab to understand cross-section... focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). +… more
- ThermoFisher Scientific (Hillsboro, OR)
- …of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy ( FIB /SEM), or Transmission Electron Microscopy ( TEM ). ... and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy with deep application knowledge in semiconductor technology,… more
- ThermoFisher Scientific (Fremont, CA)
- …education and experience: + Minimum of 8+ years of hands-on experience with dual beam ( FIB /SEM) conducting lamella ( TEM sample) preparation and other ... Unit provides solutions in pathfinding, yield learning, critical dimension (CD) metrology and failure analysis (FA) of semiconductor processes and manufacturing. Our… more